Skip to content
- Company Name:
- ELIONIX INC. Overseas Sales Department.
- Representative's name:
- 3-7-6 Motoyokoyama-cho Hachioji Tokyo 192-0063
- Electron Beam Lithography Systems.
Surface Roughness Analysis 3D Scanning Electron Microscope. -ERA Series-
- Sales Points:
- ERA-9000 : Surface Roughness Analysis 3D Scanning Electron Microscope.
Semi-in lens SEM capable of sub-nanometer 3D surface roughness analysis.
The ERA-9000 uses a semi-in lens optics system to realize low voltage ultra fine analysis. 1 nm height resolution guaranteed at low (1 kV) acceleration voltage. Capable of precise analysis of the features at the utmost sample surface.
ERA-600FE : Surface Roughness Analysis 3D Scanning Electron Microscope.
State-of-the-Art 3D Scanning Electron Microscope.
- High resolution and low acceleration voltage with a user-friendly GUI
- Optimized software to streamline analysis and eliminate the possibility of human-error
- Users can skip complicated pre-adjustment
- Topographical and Compositional images may be acquired via EDS/EBSD (Option)