ELIONIX INC.

Company Name:

ELIONIX INC.　Overseas Sales Department.

Representative's name:

Location:

3-7-6 Motoyokoyama-cho Hachioji Tokyo 192-0063

Tel:

:+81-42-626-0611

Fax:

+81-42-626-0611

E-mail:

URL:

https://www.elionix.co.jp/english/index.html

Products:

Electron Beam Lithography Systems. Surface Roughness Analysis 3D Scanning Electron Microscope.　-ERA Series-

Sales Points:

ERA-9000 : Surface Roughness Analysis 3D Scanning Electron Microscope.
Semi-in lens SEM capable of sub-nanometer 3D surface roughness analysis.
The ERA-9000 uses a semi-in lens optics system to realize low voltage ultra fine analysis. 1 nm height resolution guaranteed at low (1 kV) acceleration voltage. Capable of precise analysis of the features at the utmost sample surface.
ERA-600FE : Surface Roughness Analysis 3D Scanning Electron Microscope.
State-of-the-Art 3D Scanning Electron Microscope.
- High resolution and low acceleration voltage with a user-friendly GUI
- Optimized software to streamline analysis and eliminate the possibility of human-error
- Users can skip complicated pre-adjustment
- Topographical and Compositional images may be acquired via EDS/EBSD (Option)

Images: